– l'organisation intergouvernementale dont les États Membres agissent
en commun en ce qui concerne les sujets liés à la science des mesures
et aux étalons de mesure.
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Membres du personnel du BIPM

Directeur du Département de la chimie ; également responsable des Services informatiques
secrétaire exécutif du CCQM ; secrétaire exécutif du JCTLM


Activités (en anglais)

Dr Robert Wielgosz is the Director of the Chemistry Department within the BIPM, and responsible for the establishment, strategic development and management of the BIPM programme in Metrology in Chemistry; the formulation of programme needs and activities with stakeholders; coordination of international comparisons for air quality and greenhouse gas standards as well as organic small and large molecule primary calibrator standard comparisons. The comparison programme results in 170 participations from National Metrology Institutes (NMIs) each programme cycle.

Dr Wielgosz is the Executive Secretary for the Consultative Committee for Amount of Substance; Metrology in Chemistry and Biology (CCQM), which coordinates twenty international comparisons for NMIs annually, covering the fields of organic, inorganic, electrochemical, gas, surface and bio analysis. He is also Executive Secretary of the Joint Committee for Traceability and Laboratory Medicine (JCTLM), which develops and maintains an international database and review process for Reference Materials, Methods and Measurement Services for in vitro diagnostics. He represents the BIPM on the IUPAC Interdivisional Committee on Terminology, Nomenclature and Symbols (ICTNS).

Quelques publications

Biographie (en anglais)

Prior to establishing the Chemistry Department at the BIPM, Dr Wielgosz was a Senior Scientist at the National Physical Laboratory (UK). He has an M.A. in the Natural Sciences from Emmanuel College, Cambridge University, a Ph.D. on Electrochemical studies of Porous Silicon from the University of Bath, and he completed a Royal Society Postdoctoral Fellowship at the University of Ulm (Germany) investigating metal deposition processes on semiconductor surfaces using scanning probe microscopies.

À lire aussi
Organigramme du BIPM
Annuaire du BIPM