| |
No. |
Title |
Author |
Affiliation |
 |
WS-26 |
Microsensor arrays for trace chemical detection |
John Lu, Nell Sedransk |
NIST (USA) |
 |
WS-27 |
Ensuring best practice in software and IT for metrology |
Seton Bennett, Trevor Esward |
NPL (UK) |
 |
WS-28 |
Distributed computing: an important new tool for metrologists |
Trevor Esward |
NPL (UK) |
 |
WS-29 |
The use of Monte Carlo techniques for metrology evaluation of uncertainties and simulation of experiments |
Bernd Siebert |
PTB (Germany) |
 |
WS-30 |
Use of Penelope Monte-Carlo technique for metrology in nuclear medicine |
K.B. Lee |
KRISS (Rep. Korea) |
 |
WS-31 |
Simulation of proficiency testing results using the Monte Carlo technique |
Kil-Hoon Ahn |
KRISS (Rep. Korea) |
 |
WS-32 |
Monte Carlo uncertainties: choosing parent distributions |
Alan Steele, Rob Douglas |
NRC (Canada) |
 |
WS-33 |
Bayesian computation for linear regression and analysis of variance models |
Blaza Toman |
NIST (USA) |
 |
WS-34 |
Software components for measurement |
Blair Hall |
MSL (New Zealand) |
 |
WS-35 |
Supplements to the Guide to the Expression of Uncertainty in Measurement |
Maurice Cox, Peter Harris |
NPL (UK) |
 |
WS-36 |
Software validation in metrology: experience from PTB's activities |
Dieter Richter |
PTB (Germany) |
 |
WS-37 |
Legal metrology requirements for software in measuring instruments |
Tanaski Tasic |
MIRS (Slovenia) |
 |
WS-38 |
Web-based application for polynomial thermoelectric calculation and verification of its correction curve |
Uros Palmin |
MIRS (Slovenia) |
 |
WS-39 |
Metrological certification of algorithms and validation of corresponding software intended for measurement data processing |
Anna Chunovkina, Alexander Stepanov |
VNIIM (Russian Fed.) |
 |
WS-40 |
The evaluation of "intelligent" measurement instruments |
Gert Rietveld |
NMi (Netherlands) |