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Requirements for dimensional metrology
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 (5)
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 (7)
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The 21st Conférence Générale des Poids et Mesures,
considering that
requirements for advanced dimensional metrology continue to increase,
tolerances in high-technology manufacturing continue to fall and that in some areas they are already at the limit of what is possible today,
the range over which such requirements exist extends inclusively from the domain of nanotechnology to the domain of geophysics,
many different areas of metrology call upon realizations of SI derived units that themselves include the metre,
the most demanding requirements in dimensional metrology often call for the realization of the metre by the simplest and the most direct way possible using stabilized lasers,
to provide for the future and to ensure that the world's metrological system is capable of meeting future demand, continued basic research is essential,
recommends that national laboratories maintain a wide research base in length metrology that includes the maintenance and development of techniques to meet the diverse and growing demands in the field of dimensional metrology.
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Reference: |
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Comptes Rendus de la 21e CGPM (1999), 2001, 330
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Metrologia, 2000, 37(1), 93
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The reader should note that the official version of this Resolution is the French text.
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Other Resolutions
